dc.contributor.author | Ragel, F. C. | |
dc.contributor.author | P de V du Plessis | |
dc.contributor.author | A M Strydom | |
dc.date.accessioned | 2019-08-07T06:01:49Z | |
dc.date.available | 2019-08-07T06:01:49Z | |
dc.date.issued | 2008 | |
dc.identifier.issn | 0953-8984 | |
dc.identifier.uri | http://www.digital.lib.esn.ac.lk/handle/123456789/3930 | |
dc.description.abstract | Electrical resistivity (ρ(T)) and magnetoresistivity (MR) measurements are presented for the (Ce1−xLax)Pt2Si2 alloy system. ρ(T) data at low temperatures for alloys in the concentrated Kondo lattice regime 0≤x≤0.2 conform to a ρ(T) = ρ0+AT2 dependence and Fermi-liquid parameters A and Tcoh are presented. The maximum that occurs in ρ(T) in the concentrated Kondo lattice regime at a temperature of Tmax is no longer observed for samples with x≥0.3 which show single-ion Kondo behaviour. MR measurements on alloys with x = 0.5, 0.7 and 0.9 yield values of the Kondo temperature TK through Schlottmann analysis. The dependences of A, Tmax and TK on x are discussed in terms of the volume and Kondo hole effects occurring upon alloying. Anomalies in ρ(T) for LaPt2Si2 and some of the alloy samples are also reported. | en_US |
dc.language.iso | en | en_US |
dc.publisher | IOP PUBLISHING LTD | en_US |
dc.title | Effects of La dilution on the CePt2Si2 Kondo lattice | en_US |
dc.type | Article | en_US |
dc.identifier.sslno | 12 | en_US |